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US Government Tests RFID Passports At International Airports

Calendar Jan 16, 2006 • User Avatar Benjamin D. Thomas
1 min read
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rfid technology electronic passport airport testing government initiative international compliance
The US government has started testing electronic passports which contain an RFID chip holding information and a digital photo of the passport's carrier. The tests started yesterday at San Francisco airport, Changi Airport in Singapore and Sydney Airport in Australia. Singapore Airlines crew, some US diplomats and some citizens from Australia and New Zealand are carrying the new passports.

The tests will evaluate the impact of new equipment and software to verify the chipped passports. They will also collect information to make it easier for other countries to join the scheme and stay within international standards.

The link for this article located at TheRegister.co.uk is no longer available.